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Scan circuit is widely practiced DFT technology. The scan testing procedure consist of state initialization, test application, response capture and observation process. During the state initialization process the scan vectors are shifted into the scan cells and simultaneously the responses captured in last cycle are shifted out. During this shift operation the transitions that arise in the scan ce
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"Search is our greatest adventure" (Rolf Edberg). Join me in this adventure and experience the same joy, enlightment, and insight that this journey of discoveries during 50 years has given me! The journey, way, narrative begins with criticism of fiction and goes via rethinking of literary research, humanities, and natural science to the discovery of a "humanistic" natural science, a "world philo
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Textual criticism-comparison of two different transcripts (one from the Cultural Revolution, the other in an official post-CR source) of CCP-Vice Chairman Liu Shaoqi's speech at 1962 conference in Beijing.